Short Circuit and Recovery Time Tests in a Helical Bifilar R-SFCL Module

Título:

Short Circuit and Recovery Time Tests in a Helical Bifilar R-SFCL Module

Autor:

Daniel Henrique Nogueira Dias

Ano:

2021

DOI:

10.1590/2179-10742021v20i21076

Revista:

Journal of Microwaves, Optoelectronics and Electromagnetic Applications

ISSN:

21791074

Idioma:

Português

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