Combined short scale roughness and surface dielectric function gradient effects on the determination of tip-sample force in atomic force microscopy

Título: 
Combined short scale roughness and surface dielectric function gradient effects on the determination of tip-sample force in atomic force microscopy
Autor: 
Ano: 
2013
Idioma: 
Inglês
DOI: 
10.1063/1.4829936
ISSN: 
36951
Home: 
doi:10.1063/1.4829936